oden/third-party/vendor/ab_glyph_rasterizer/CHANGELOG.md

0.1.8

• Do SIMD runtime detection only once on the first Rasterizer::new instead of on each.

0.1.7

• Fix x86, x86_64 no_std builds, require std feature for runtime detected SIMD.

0.1.6

• Add runtime detected AVX2 or SSE4.2 line drawing. Improves performance on compatible x86_64 CPUs.

0.1.5

• Remove cap of 1.0 for coverage values returned by for_each_pixel now >= 1.0 means fully covered. This allows a minor reduction in operations / performance boost.

0.1.4

• Add Rasterizer::reset, Rasterizer::clear methods to allow allocation reuse.

0.1.3

• Fix index oob panic scenario.

0.1.2

• For Point implement Sub, Add, SubAssign, AddAssign, PartialEq, PartialOrd, From<(x, y)>, From<[x, y]> for easier use downstream.
• Switch Point Debug implementation to output point(1.2, 3.4) smaller representation referring to the point fn.

0.1.1

• Add explicit compile error when building no_std without the "libm" feature.

0.1

• Implement zero dependency coverage rasterization for lines, quadratic & cubic beziers.